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Institut f. Physik
FG Nanostrukturierte Materialien
Martin-Luther-Universitat
Halle-Wittenberg
Von-Danckelmann-Platz 3,
D-06120 Halle, Germany

Tel.:  +49 345 55 25321
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Abstract

L. Nowicki, A.M. Abdul-Kader, P. Bach, G. Schmidt, L.W. Molenkamp, A. Turos, G. Karczewski
Structural characterization of half-metallic Heusler compound NiMnSb
Nuclear Instruments and Methods in Physics Research B 219 (2015-02-24 16:12:45), 666-670

High resolution X-ray diffraction (HRXRD) and Rutherford backscattering/channeling (RBS/c) techniques were used to characterize layers of NiMnSb grown by molecular beam epitaxy (MBE) on InP with a InxGa1?xAs buffer. Angular scans in the channeling mode reveal that the crystal structure of NiMnSb is tetragonally deformed with c/a=1.010±0.002, in agreement with HRXRD data. Although HRXRD demonstrates the good quality of the pseudomorphic NiMnSb layers the channeling studies show that about 20% of atoms in the layers do not occupy lattice sites in the [0 0 1] rows of NiMnSb. The possible mechanisms responsible for the observed disorder are discussed.

http://www.sciencedirect.com/science/article/pii/S0168583X0400179X
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