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Institut f. Physik
FG Nanostrukturierte Materialien
Martin-Luther-Universitat
Halle-Wittenberg
Von-Danckelmann-Platz 3,
D-06120 Halle, Germany

Tel.:  +49 345 55 25321
Fax.: +49 345 55 27034

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Abstract

C. Hauser, T. Richter, N. Homonnay, C. Eisenschmidt, Q. Mohammad, H. Deniz, D. Hesse, M. Sawicki, S.G. Ebbinghaus, G. Schmidt
Yttrium Iron Garnet Thin Films with Very Low Damping Obtained by Recrystallization of Amorphous Material
Scientific Reports 6 (2017-04-14 13:05:33), 20827
DOI: doi:10.1038/srep20827


We have investigated recrystallization of amorphous Yttrium Iron Garnet (YIG) by annealing in oxygen atmosphere. Our findings show that well below the melting temperature the material transforms into a fully epitaxial layer with exceptional quality, both structural and magnetic. In ferromagnetic resonance (FMR) ultra low damping and extremely narrow linewidth can be observed. For a 56 nm thick layer a damping constant of alpha = (6.15 +/- 1.50) . 10(-5) is found and the linewidth at 9.6 GHz is as small as 1.30 +/- 0.05 Oe which are the lowest values for PLD grown thin films reported so far. Even for a 20 nm thick layer a damping constant of a = (7.35 +/- 1.40) . 10(-5) is found which is the lowest value for ultrathin films published so far. The FMR linewidth in this case is 3.49 +/- 0.10 Oe at 9.6 GHz. Our results not only present a method of depositing thin film YIG of unprecedented quality but also open up new options for the fabrication of thin film complex oxides or even other crystalline materials.

https://www.nature.com/articles/srep20827
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