Fachgruppe Nanostrukturierte Materialien |
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Institut f. Physik
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F. Heyroth, H.-R. Höche and C. Eisenschmidt Contrast in X-ray section topographs of perfect silicon crystals using the Laue-Laue three-beam case of diffraction J. Appl. Cryst. 32 (2015-02-25 07:45:32), 489-496 Section topographs taken in three-beam diffraction geometry and in the neighbourhood of this geometric position are presented. They show new contrast phenomena which are discussed in terms of the dynamical diffraction theory, the effective structure factor and the dispersion surface. © Journal of Applied Crystallography |